Issue No. 02 - April-June (2000 vol. 17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.844334
<p>This article presents a methodology to cope with the simultaneous optimization of multiple competing objectives and the different sources of heterogeneity in embedded system design.</p>
L. Thiele, M. Eisenring and E. Zitzler, "Conflicting Criteria in Embedded System Design," in IEEE Design & Test of Computers, vol. 17, no. , pp. 51-59, 2000.