The Community for Technology Leaders
Green Image
INDEX TERMS
CITATION
Jerry M. Soden, Charles F. Hawkins, "Deep Submicron CMOS Current IC Testing: Is There a Future?", IEEE Design & Test of Computers, vol. 16, no. , pp. 14-15, October-December 1999, doi:10.1109/MDT.1999.808198
175 ms
(Ver 3.1 (10032016))