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Issue No. 03 - July-September (1999 vol. 16)
ISSN: 0740-7475
pp: 112-116
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CITATION

"A D&T Roundtable: RF Integration into CMOS and Deep-Submicron Challenges," in IEEE Design & Test of Computers, vol. 16, no. , pp. 112-116, 1999.
doi:10.1109/MDT.1999.10017
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