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Issue No. 03 - July-September (1999 vol. 16)
ISSN: 0740-7475
pp: 23-27
ABSTRACT
This article explores current and future design for test implementation alternatives, including their impact on various product performance, yield, and test development time characteristics. It also discusses the relationship between electronic design for test automation and its effects on overall time to market for application-specific and system-on-chip (SoC) integrated circuits (ICs).
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CITATION
Jon Turino, "Design for Test and Time to Market: A Personal Perspective", IEEE Design & Test of Computers, vol. 16, no. , pp. 23-27, July-September 1999, doi:10.1109/54.785824
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