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Issue No. 02 - April-June (1999 vol. 16)
ISSN: 0740-7475
pp: 84-91
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CITATION

"IC Reliability and Test: What Will Deep Submicron Bring?," in IEEE Design & Test of Computers, vol. 16, no. , pp. 84-91, 1999.
doi:10.1109/MDT.1999.10010
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