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A case study of the development of the design for test methodology of the second generation of the ColdFire(r) Microprocessor family is described from the viewpoint of goals, initial strategy, and implementation. Methodology includes at-speed scan path design, path delay testing, IDDQ, and direct access test modes for embedded memories. Scan tests are applied with timing identical to that specified for peak performance normal operation.
DFT, ColdFire, microprocessor design, scan tests

G. Giles, R. Eisele, D. Amason, M. Mateja and A. L. Crouch, "Test Development for Second-Generation ColdFire Microprocessors," in IEEE Design & Test of Computers, vol. 15, no. , pp. 70-76, 1998.
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