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Issue No.03 - July-September (1998 vol.15)
pp: 58-63
<p>The PA7300 was the first PA-RISC microprocessor to incorporate an on-chip cache. To test its 128-Kbyte memory, test hardware was included consisting of an input register, an output MISR, an LFSR address source, and a state machine. The state machine was capable of executing a predefined march test with a fixed address sequence and programmable data pattern. The successes achieved on the PA7300 using this strategy, combined with some of its shortcomings, have lead to the development of a memory test subsystem on Hewlett Packard's next microprocessor, the PA8500.</p> <p>This article describes the memory test hardware on the PA8500, beginning with the requirements that motivated the design. An explanation of the cache architecture is given, and followed by a description of the blocks that make up the memory test subsystem. The final section presents an example that shows how the subsystem can be used to test the memory.</p>
Memory test hardware, PA8500, cache architecture, cache design
Jeff Brauch, Jay Fleischman, "Design of Cache Test Hardware on the HP PA8500", IEEE Design & Test of Computers, vol.15, no. 3, pp. 58-63, July-September 1998, doi:10.1109/54.706034
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