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William D. Atwell, Jr.,, T.w. Williams, David Y. Lepejian, Farzad Zarrinfar, Gary D. Fleeman, Meh-Ron Amerian, Yervant Zorian, Ian Burgess, "A D&T Roundtable: Testing Mixed Logic and DRAM Chips", IEEE Design & Test of Computers, vol. 15, no. , pp. 86-92, April-June 1998, doi:10.1109/MDT.1998.679212
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