Issue No. 02 - April-June (1998 vol. 15)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.679211
Fault models are introduced for analog components described on the functional level. Conditions for the output manifestation of functional faults are derived, with a spread in analog output values allowed for. The study made has shown that only the function of a faulty-free component may be used to select input test stimuli which should ensure the manifestation of its faults. The results obtained may be used to select test stimuli for analog printed-circuit board.
Analog test, ICs, fault models, PCBs
Y. V. Malyshenko, "Functional Fault Models for Analog Circuits," in IEEE Design & Test of Computers, vol. 15, no. , pp. 80-85, 1998.