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ABSTRACT
In order to meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming a requirement. The use of these techniques affects many parts of the product design and manufacturing processes. This paper describes the development and deployment of an automated diagnosis methodology within Texas Instruments.
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CITATION
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena, "Automated Diagnosis in Testing and Failure Analysis", IEEE Design & Test of Computers, vol. 14, no. , pp. 83-89, July-September 1997, doi:10.1109/54.606003
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