Issue No. 03 - July-September (1997 vol. 14)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.606003
In order to meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming a requirement. The use of these techniques affects many parts of the product design and manufacturing processes. This paper describes the development and deployment of an automated diagnosis methodology within Texas Instruments.
Anjali Kinra, Jeff Platt, Jayashree Saxena, Kenneth M. Butler, Karl Johnson, "Automated Diagnosis in Testing and Failure Analysis", IEEE Design & Test of Computers, vol. 14, no. , pp. 83-89, July-September 1997, doi:10.1109/54.606003