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Issue No. 03 - July-September (1997 vol. 14)
ISSN: 0740-7475
pp: 70-75
ABSTRACT
<p>Failure analysts no longer can wait till defective products come back from the field. Today, they must take a proactive role, detecting failures before they occur and helping designers eliminate their causes.</p>
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CITATION
Eugene R. Hnatek, Donald Staab, "Diagnosing IC Failures in a Fast Environment", IEEE Design & Test of Computers, vol. 14, no. , pp. 70-75, July-September 1997, doi:10.1109/54.606000
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