Issue No. 03 - July-September (1997 vol. 14)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.606000
<p>Failure analysts no longer can wait till defective products come back from the field. Today, they must take a proactive role, detecting failures before they occur and helping designers eliminate their causes.</p>
E. R. Hnatek and D. Staab, "Diagnosing IC Failures in a Fast Environment," in IEEE Design & Test of Computers, vol. 14, no. , pp. 70-75, 1997.