Issue No. 03 - July-September (1997 vol. 14)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.605993
First introduced in a keynote speech from the Test Economics Workshop at ITC 1996, this article explores the forces driving design validation testing and production testing into the 21st Century. Topics span time-to-market issues, reducing the number of silicon "spins," equalizing device performance, test costs and cost ratios. Design for testability implications are examined, as well as the need for physical device validation. As we close one of the most revolutionary decades in IC development, and as increases in integration, complexity and speed continue to push the envelope of IC design, the article concludes with a global view of test development strategy for the coming century.
time to market, reducing silicon spins, design-test cost ratios, physical device validation, test strategy
Jon Turino, "Test Economics in the 21st Century", IEEE Design & Test of Computers, vol. 14, no. , pp. 41-44, July-September 1997, doi:10.1109/54.605993