Issue No. 03 - July-September (1997 vol. 14)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.605985
<p>In his keynote speech at the 1997 VLSI Test Symposium, held in April in Monterey, California, Gadi Singer presented his view of the future of test and design for testability. In addition, Singer, general manager of design technology at Intel Corporation, where he has worked for 15 years, posed several challenges to the design and test community. Here, he summarizes his major points.</p>
G. Singer, "The Future of Test and DFT," in IEEE Design & Test of Computers, vol. 14, no. , pp. 11-14, 1997.