Issue No. 02 - April-June (1997 vol. 14)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.587738
<p>Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects.</p>
M. Sachdev, "Open Defects in CMOS RAM Address Decoders," in IEEE Design & Test of Computers, vol. 14, no. , pp. 26-33, 1997.