The Community for Technology Leaders
Green Image
Issue No. 02 - April-June (1997 vol. 14)
ISSN: 0740-7475
pp: 26-33
ABSTRACT
<p>Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects.</p>
INDEX TERMS
CITATION
Manoj Sachdev, "Open Defects in CMOS RAM Address Decoders", IEEE Design & Test of Computers, vol. 14, no. , pp. 26-33, April-June 1997, doi:10.1109/54.587738
98 ms
(Ver )