Issue No. 01 - January-March (1997 vol. 14)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.573352
<p>This article describes the testability, debuggability, and manufacturability features of the UltraSPARC family of microprocessors. Due to the aggressive nature of this high-performance design, these three areas needed to be addressed at the beginning of the project to ensure success.</p> <p>We present the goals and analysis that led to our decisions as well as the actual features that were implemented. The features described here have helped enormously in achieving the time-to-volume goals and hence the overall success of the product.</p>
Processor design, testability, manufacture
M. E. Levitt, "Designing UltraSparc for Testability," in IEEE Design & Test of Computers, vol. 14, no. , pp. 10-17, 1997.