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The authors describe ATE planning effects on the total LSI manufacturing costs through simulation analysis, which uses a combination of the event-scheduling approach and detailed parametric models. They show that the method is useful in predicting the cost effects of ATE planning in the LSI manufacturing system.
VLSI manufacturing system, test cost, LSI tester, evaluation
Koji Nakamae, Homare Sakamoto, Hiromu Fujioka, "How ATE Planning Affects LSI Manufacturing Cost", IEEE Design & Test of Computers, vol. 13, no. , pp. 66-73, Winter 1996, doi:10.1109/54.544538
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