Issue No. 04 - Winter (1996 vol. 13)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.544535
A novel test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters using static parameters are proposed. Offset, gain, integral nonlinearity (INL) and differential nonlinearity (DNL) are tested without using mixed-mode or logic test equipment. The proposed BIST structure presents a compromise between area overhead (AO), test time, and fault coverage. The BIST circuitry has been designed and evaluated using CMOS 1.2-micron technology. The simulations show that, assuming the BIST voltage references fulfill the required accuracy, the BIST structure is applicable for testing D/A and A/D converters up to 16-bits of resolution. By only a minor modification, the test structure would be able to localize the fail situation and to test all D/A converters on the same chip. The small value of AO, the simplicity and efficiency of the proposed BIST architectures seem to be promising for manufacturing.
B. Kaminska, K. Arabi and J. Rzeszut, "BIST for D/A and A/D Converters," in IEEE Design & Test of Computers, vol. 13, no. , pp. 40-49, 1996.