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Issue No. 04 - Winter (1996 vol. 13)
ISSN: 0740-7475
pp: 8,89-91
<p><it>[This column summarizes the key points of two talks given by Wojciech Maly at the European Design and Test Conference, Paris, March 1996, and the International Test Conference, Washington, D.C., October 1996. Maly is a professor in the Electrical and Computer Engineering Department at Carnegie Mellon University. A Fellow of the IEEE, he holds an MSc in electronic engineering from the Technical University of Warsaw, Poland, and a PhD from the Institute of Applied Cybernetics, Polish Academy of Sciences.—Ed.]</it></p>

W. Maly, "The future of IC design, testing, and manufacturing," in IEEE Design & Test of Computers, vol. 13, no. , pp. 8,89-91, 1996.
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