Issue No.01 - Spring (1996 vol.13)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.485784
This article is a tutorial covering the introduction of frequency domain analysis for the testing of mixed-signal devices. The article covers dynamic testing of analog-to-digital converters using Fourier analysis. It is aimed at digital design and test engineers making the transition from devices with digital only content to devices with both digital and analog or mixed-signal content. The article introduces the test methodologies for Fourier analysis including coherent sampling techniques. It also covers the challenges of implementing these techniques in a real system including analyzing the results to identify test implementation problems.
Mixed-Signal, Testing, Analog-to-Digital, Converters
Joseph A. Mielke, "Frequency Domain Testing of ADCs", IEEE Design & Test of Computers, vol.13, no. 1, pp. 64-69, Spring 1996, doi:10.1109/54.485784