Issue No. 01 - Spring (1996 vol. 13)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.485782
A new, generalized approach on the basis of alternative graphs (AG) to test synthesis and analysis for digital systems is proposed. AGs permit an efficient uniform model for describing the structure, functions, as well faults in a wide class of digital circuits at different representation levels. This model also supports a wide class of test design tasks--test generation, two- or multivalued simulation, test quality analysis, statistical fault grading, testability analysis, etc. Unlike the known methods, the proposed AG approach allows the use of a single uniform model library for solving these tasks.
Digital systems, test synthesis, test analysis, alternative graphs
R. Ubar, "Test Synthesis with Alternative Graphs," in IEEE Design & Test of Computers, vol. 13, no. , pp. 48-57, 1996.