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Issue No. 01 - Spring (1996 vol. 13)
ISSN: 0740-7475
pp: 2
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CITATION
John W. Sheppard, "SCC20 attracts IEC participation", IEEE Design & Test of Computers, vol. 13, no. , pp. 2, Spring 1996, doi:10.1109/MDT.1996.10000
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