Issue No. 03 - Fall (1995 vol. 12)
IDDQ testing has become a powerful tool for improving the quality of CMOS integrated circuits. One drawback of this testing is its speed--often compromising speed for accuracy, or vice versa. Given that a well-designed part will have a very low quiescent current, accuracy cannot be sacrificed; given that test time is perhaps the most expensive part of an IC's final cost, speed cannot be sacrificed. This article describes QuiC-Mon, a loadboard mounted circuit which is capable of offering both speed and accuracy--over 1-MHz measurement rates at sub-mA accuracy.
IDDQ, ISSQ, current testing, QTAG, IC quality, QuiC-Mon
K. M. Wallquist, "Achieving IDDQ/ISSQ Production Testing with QuiC-Mon," in IEEE Design & Test of Computers, vol. 12, no. , pp. 62-69, 1995.