Issue No. 02 - Summer (1995 vol. 12)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.386006
This article discusses the "state of the union" of the 1149.1 standard and celebrates the success of the IEEE 1149.1 standard while motivating some discussion and future action to encourage further development of boundary scan based testing. The point of view is that of the implementer in a competitive business environment.
IEEE Std 1149.1, Boundary-Scan, Board Test, BIST, System Test
M. M. Tegethoff and K. P. Parker, "IEEE Std 1149.1:Where Are We? Where From Here?," in IEEE Design & Test of Computers, vol. 12, no. , pp. 53-59, 1995.