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ABSTRACT
A case study of the use of IDDQ testing in the design and testing of the Hewlett-Packard PA7100LC PA-RISC microprocessor. This 900, 000 transistor custom design supports IDDQ test to ensure high quality without compromising 100 MHz+ performance. Design guidelines, measurement techniques and results are presented.
INDEX TERMS
Microprocessor test, design for test, IDDQ testing
CITATION

D. Josephson, D. Dixon and M. Storey, "Microprocessor IDDQ Testing: A Case Study," in IEEE Design & Test of Computers, vol. 12, no. , pp. 42-52, 1995.
doi:10.1109/54.386005
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