Issue No. 02 - Summer (1995 vol. 12)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.386005
A case study of the use of IDDQ testing in the design and testing of the Hewlett-Packard PA7100LC PA-RISC microprocessor. This 900, 000 transistor custom design supports IDDQ test to ensure high quality without compromising 100 MHz+ performance. Design guidelines, measurement techniques and results are presented.
Microprocessor test, design for test, IDDQ testing
D. Josephson, D. Dixon and M. Storey, "Microprocessor IDDQ Testing: A Case Study," in IEEE Design & Test of Computers, vol. 12, no. , pp. 42-52, 1995.