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Issue No. 03 - July/September (1994 vol. 11)
ISSN: 0740-7475
pp: 28-38
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CITATION

C. L. Lee and M. Sheu, "Simplifying Sequential Circuit Test Generation," in IEEE Design & Test of Computers, vol. 11, no. , pp. 28-38, 1994.
doi:10.1109/MDT.1994.303845
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