Issue No. 02 - April/June (1994 vol. 11)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.282446
<p>This implementation strategy enables incremental test of all system components, providing an alternative solution to the known good die testing problem. The authors present a simple microcontroller emulator designed and fabricated for study of the test logic needed as a key component of this method.</p>
D. B. Feltham, M. D. Hobaugh, A. E. Gattiker, W. Maly, M. E. Thomas and K. Backus, "Smart-Substrate Multichip-Module Systems," in IEEE Design & Test of Computers, vol. 11, no. , pp. 64-73, 1994.