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<p>This implementation strategy enables incremental test of all system components, providing an alternative solution to the known good die testing problem. The authors present a simple microcontroller emulator designed and fabricated for study of the test logic needed as a key component of this method.</p>
Derek B.I. Feltham, Mark D. Hobaugh, Anne E. Gattiker, Wojciech Maly, Michael E. Thomas, Kenneth Backus, "Smart-Substrate Multichip-Module Systems", IEEE Design & Test of Computers, vol. 11, no. , pp. 64-73, April/June 1994, doi:10.1109/54.282446
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