Issue No. 01 - January/March (1994 vol. 11)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.262322
<p>The author discusses the history and benefits of design for test. He describes common arguments against it and gives convincing rebuttals to each. In addition, he provides a glimpse into the future of DFT. The problem is that we do not have a measurable parameter that expresses the incremental gain in product quality arising from the addition of some specific DFT technique, compared to its cost of implementation. The author refers to this parameter as the quality improvement factor (Quif), and defines it as the benefit versus the cost of the DFT technique.</p>
R. (. Bennitts, "Progress in Design for Test: A Personal View," in IEEE Design & Test of Computers, vol. 11, no. , pp. 53-59, 1994.