Issue No. 02 - April/June (1993 vol. 10)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.211526
<p>Test algorithms for static double-buffered RAMs and pointer-addressed memories (PAMs) are presented. The reasons why test algorithms for single-buffered memories are inadequate to test double-buffered memories (DBMs) are discussed. To obtain a realistic fault model, the authors perform an inductive fault analysis on the DBM cells. They also show that the address generation method imposes different requirements on the test algorithms.</p>
J. van Sas, H. J. De Man and F. Catthoor, "Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories," in IEEE Design & Test of Computers, vol. 10, no. , pp. 34-44, 1993.