Issue No. 02 - April/June (1993 vol. 10)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.211525
<p>A method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs (SRAMs) is presented. The BISD circuit, with self-repair, requires about 5% extra area in a 64-kb SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required. The algorithms, hardware design, and design costs and tradeoffs are discussed.</p>
R. Treuer and V. K. Agarwal, "Built-In Self-Diagnosis for Repairable Embedded RAMs," in IEEE Design & Test of Computers, vol. 10, no. , pp. 24-33, 1993.