Issue No. 02 - April/June (1993 vol. 10)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.211523
<p> Two testing techniques for ultra-large-scale integrated (ULSI) memories containing on-chip voltage downconverters (VDCs) are described. The first in an on-chip VDC tuning technique that adjusts internal V/sub CC/ to compensate for the monitored characteristics of the process parameters during repair analysis testing. The second is an operating-voltage margin test, performed at various internal V/sub CC/ levels during the water sort test (WT) and the final shipping test (FT).</p>
K. Suma et al., "Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters," in IEEE Design & Test of Computers, vol. 10, no. , pp. 6-12, 1993.