Issue No. 01 - January/March (1993 vol. 10)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.199807
<p>An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed.</p>
V. D. Agrawal, K. K. Saluja and C. R. Kime, "A Tutorial on Built-in Self-Test. I. Principles," in IEEE Design & Test of Computers, vol. 10, no. , pp. 73-82, 1993.