The Community for Technology Leaders
Green Image
ABSTRACT
<p>An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed.</p>
INDEX TERMS
CITATION
Vishwani D. Agrawal, Kewal K. Saluja, Charles R. Kime, "A Tutorial on Built-in Self-Test. I. Principles", IEEE Design & Test of Computers, vol. 10, no. , pp. 73-82, January/March 1993, doi:10.1109/54.199807
99 ms
(Ver )