Issue No. 01 - January/March (1993 vol. 10)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.199805
<p>The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed.</p>
J. W. Sheppard and W. R. Simpson, "Fault Isolation in an Integrated Diagnostic Environment," in IEEE Design & Test of Computers, vol. 10, no. , pp. 52-66, 1993.