The Community for Technology Leaders
Green Image
INDEX TERMS
CITATION
John P. Hayes, Pinaki Mazumder, "Guest Editor's Introduction: Testing and Improving the Testability of Multimegabit Memories", IEEE Design & Test of Computers, vol. 10, no. , pp. 6-7, January/March 1993, doi:10.1109/MDT.1993.10003
128 ms
(Ver 3.1 (10032016))