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<p>An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.</p>

M. Slamani and B. Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," in IEEE Design & Test of Computers, vol. 9, no. , pp. 30-39, 1992.
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