Issue No. 01 - January/March (1992 vol. 9)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.124515
<p>An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.</p>
M. Slamani and B. Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," in IEEE Design & Test of Computers, vol. 9, no. , pp. 30-39, 1992.