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Issue No. 03 - July/September (1991 vol. 8)
ISSN: 0740-7475
pp: 44-48
<p>A variable slew rate, together with the ability to control ascending and descending slew rates independently, significantly improves the overall accuracy of test and verification systems for application-specific ICs. Although a high slew rate is usually desirable, in some cases, such as ECL devices and devices in circuits of older vintage, a variable rate is advantageous. Essential driver characteristics are identified, and the driver model is described. For a small parts cost, and with only a negligible increase in power requirements, it is estimated that independent control of slew rates for ascending and descending edges can improve tester accuracy by several hundred picoseconds.</p>

B. Dahlberg, "Increasing Test Accuracy by Varying Driver Slew Rate," in IEEE Design & Test of Computers, vol. 8, no. , pp. 44-48, 1991.
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