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<p>A description is given of the Diodes system, a complete rapid prototyping, debugging, and test environment including both hardware and software, for the design of digital-signal-processing chips. The test circuitry in Diodes differs from that in many systems, including those based on boundary scan, by offering full-speed circuit testing and the observation of internal nodes during real time. Diodes also achieves nearly 100% fault coverage because chips are composed of numerous chunks, each of which is tested exhaustively. The discussion covers the high-density interconnection technology and the concepts on which Diodes is based, two types of chips that have been designed, fabricated, and tested for Diodes: module assembly and fabrication; synthesis software; on-chip testing; Diodes test circuitry; test modes; and hardware and software debugging. Diodes is compared with other testing approaches and other rapid prototyping systems.</p>
Paul Delano, Abhjit Chatterjee, Colin Rafferty, Michael Hartman, Richard Hartley, Barbara Molnar, Kenneth Welles II, "A Rapid-Prototyping Environment for Digital-Signal Processors", IEEE Design & Test of Computers, vol. 8, no. , pp. 11-25, April/June 1991, doi:10.1109/54.82035
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