Issue No. 06 - November/December (1990 vol. 7)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.64956
<p>The author discusses the two main problems of dynamic testing (i.e. testing while the simulator is running), namely the design of a high-level vector-generation language and the design of the interface between the vector generator and the simulator. He offers guidelines for designing a high-level vector-generation language as well as several examples written in FHDL, a driver language developed at the University of South Florida. The author also describes a solution to interface design that is based on a special interface data structure that supports several styles of vector generators and interactive circuit debugging.</p>
P. M. Maurer, "Dynamic Functional Testing for VLSI Circuits," in IEEE Design & Test of Computers, vol. 7, no. , pp. 42-49, 1990.