Issue No. 04 - July/August (1990 vol. 7)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.57909
<p>In a totally self-checking (TSC) design, the circuit detects errors by monitoring redundantly coded data/control paths through a TSC checker. A problem arises when not all these code words are on the monitored lines during normal operation. A method of designing checkers that solves this difficulty is proposed. The method uses TSC checkers based on flip-flops instead of using the mostly combinational checkers now available. Two design applications are presented: TSC checkers for arithmetic AN codes, and a TSC iterative logic array.</p>
S. M. Reddy and S. Kundu, "Embedded Totally Self-Checking Checkers: A Practical Design," in IEEE Design & Test of Computers, vol. 7, no. , pp. 5-12, 1990.