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Issue No. 04 - July/August (1990 vol. 7)
ISSN: 0740-7475
pp: 4
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CITATION

K. D. Wagner, "Guest Editorial: The Many Faces of Test," in IEEE Design & Test of Computers, vol. 7, no. , pp. 4, 1990.
doi:10.1109/MDT.1990.10017
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