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<p>A testability strategy for a complex VLSI device that is implemented in the Piramid digital-signal-processor silicon compiler is presented. The macro test method proposed supports built-in self-test, scan test, restricted partial scan, and test-control logic at various levels in the design hierarchy. The strategy uses techniques such as a macro test plan, transfer information, and intermediate vector storage. The overhead from adding testability is only 10% of the total area and test-program generation is done with 100% fault coverage in a very short time, since there is no need for global test-pattern generation. A set of tools that guide the testability implementation from design to the final test program is described.</p>

F. Beenker, R. Stans, M. Van der Star and B. J. Dekker, "Implementing Macro Test in Silicon Compiler Design," in IEEE Design & Test of Computers, vol. 7, no. , pp. 41-51, 1990.
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