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ABSTRACT
<p>The evolution of a testing method and architecture of a logic-device tester to be used for the next generation of IBM's high-density CMOS ASIC (application-specific integrated circuit) logic components is described. The tester's design is based on the architecture of an existing IBM memory tester rather than on a conventional logic-tester design. The testing strategy calls for boundary-scan in each component design, built-in self-test logic within embedded memory arrays, and the use of weighted random-pattern logic testing. The development of the tester hardware is discussed, and capital costs of the new tester are compared with those of other approaches.</p>
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CITATION
Robert W. Bassett, Stephen L. Dingle, Donald L. Wheater, Jeannie H. Panner, John G. Petrovick Jr., Barry J. Butkus, Marc R. Faucher, Pamela S. Gillis, "Low-Cost Testing of High-Density Logic Components", IEEE Design & Test of Computers, vol. 7, no. , pp. 15-28, March/April 1990, doi:10.1109/54.53042
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