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Issue No.01 - January/February (1990 vol.7)
pp: 39-45
ABSTRACT
<p>The author suggests that if the information necessary for testing a digital IC or printed-circuit board is kept and transferred in a standardized format, testing will be much easier. He describes the concept of a test-specification format (TSF) and reports the results of experiments with two candidate TSFs. The first, Tandem, is a restricted implementation that uses ITF, aPhilips internal language, to specify tests. The practical use of a TSF was studied by evaluating NCF (neutral code format), a well-documented and stable language. Although the two languages investigated were not true TSFs, the author shows that placing a language between CAD and test systems creates a powerful environment that could greatly reduce test-preparation time and test costs.</p>
CITATION
Bas Verhelst, "Using a Test-Specification Format in Automatic Test-Program Generation", IEEE Design & Test of Computers, vol.7, no. 1, pp. 39-45, January/February 1990, doi:10.1109/54.46892
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