Issue No. 05 - September/October (1989 vol. 6)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.43075
<p>A set of expert-system modules for designing easily testable VLSI circuits called DFT Expert is described. DFT Expert operates at the register-transfer level of circuit description, classifying circuit components into data transporters (DTs) and data processors (DPs). It identifies DPs and DTs, selects a test method, configures global design for test (DFT), and generates test schedules. DFT Expert's ability to test a practical circuit is demonstrated.</p>
P. Palchaudhuri and S. Bhawmik, "DFT Expert: Designing Testable VLSI Circuits," in IEEE Design & Test of Computers, vol. 6, no. , pp. 8-19, 1989.