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Issue No. 05 - September/October (1989 vol. 6)
ISSN: 0740-7475
pp: 8-19
<p>A set of expert-system modules for designing easily testable VLSI circuits called DFT Expert is described. DFT Expert operates at the register-transfer level of circuit description, classifying circuit components into data transporters (DTs) and data processors (DPs). It identifies DPs and DTs, selects a test method, configures global design for test (DFT), and generates test schedules. DFT Expert's ability to test a practical circuit is demonstrated.</p>

P. Palchaudhuri and S. Bhawmik, "DFT Expert: Designing Testable VLSI Circuits," in IEEE Design & Test of Computers, vol. 6, no. , pp. 8-19, 1989.
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