Issue No. 03 - May/June (1989 vol. 6)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.32413
<p>A broad-level implementation of signature analysis that uses a built-in test module called a testing switch is presented. It is shown how board designers can incorporate the testing-switch modules to reduce the time it takes to isolate faulty chips. Both the test time and the power overhead are better with the testing-switch implementation than with schemes using built-in logic block observer circuits. The proposed technique is especially useful when boundary scan and self-test cannot be implemented in every chip of a board.</p>
N. Vasanthavada and N. Kanopoulos, "A Built-In Test Module for Fault Isolation," in IEEE Design & Test of Computers, vol. 6, no. , pp. 58-65, 1989.