Issue No. 01 - January/February (1989 vol. 6)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.20388
<p>The authors propose a way to merge boundary scan with the built-in self-test (BIST) of printed circuit boards. Their boundary-scan structure is based on Version 2.0 of the Joint Task Action Group's recommendations for boundary scan and incorporates BIST using a register based on cellular automata (CA) techniques. They examine test patterns generated from this register and the more conventional linear-feedback shift register. The advantages of the CA register, or CAR, are its modularity, which allows modification without major redesign, its higher stuck-at fault coverage, and its higher transition fault coverage.</p>
F. Brglez and C. S. Gloster Jr., "Boundary Scan with Built-In Self-Test," in IEEE Design & Test of Computers, vol. 6, no. , pp. 36-44, 1989.