Issue No. 01 - January/February (1989 vol. 6)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.20386
<p>The test-head subsystem presented uses gallium arsenide pin electronics to provide nonrepeating zero data rates up to 1.2 Gb/s. The device under test is connected to laser-scanned optical sensors, and the test system receivers use an electrooptic measurement method to capture the pin information. The receiver has a 4.5-GHz bandwidth and can perform functional test at the emitter-coupled logic level with one sampling pulse per vector. The device environment supports signals bandwidths near 5 GHz.</p>
F. Henley, "An Ultra High Speed Test System," in IEEE Design & Test of Computers, vol. 6, no. , pp. 18-24, 1989.