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Issue No. 01 - January/February (1989 vol. 6)
ISSN: 0740-7475
pp: 18-24
ABSTRACT
<p>The test-head subsystem presented uses gallium arsenide pin electronics to provide nonrepeating zero data rates up to 1.2 Gb/s. The device under test is connected to laser-scanned optical sensors, and the test system receivers use an electrooptic measurement method to capture the pin information. The receiver has a 4.5-GHz bandwidth and can perform functional test at the emitter-coupled logic level with one sampling pulse per vector. The device environment supports signals bandwidths near 5 GHz.</p>
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CITATION
Francois Henley, "An Ultra High Speed Test System", IEEE Design & Test of Computers, vol. 6, no. , pp. 18-24, January/February 1989, doi:10.1109/54.20386
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