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ABSTRACT
<p>Surveys recent research activities in test technology for computers, focusing on the results of university researchers. They cover test-pattern generation, fault simulation, design for testability, built-in self-test, and self-checking.</p>
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CITATION

Y. Takamatsu, K. Furuya, H. Tamamoto, T. Nanya, H. Fujiwara and T. Yamada, "Test Research in Japan," in IEEE Design & Test of Computers, vol. 5, no. , pp. 60-79, 1988.
doi:10.1109/54.7982
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