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Issue No.05 - September/October (1988 vol.5)
pp: 60-79
<p>Surveys recent research activities in test technology for computers, focusing on the results of university researchers. They cover test-pattern generation, fault simulation, design for testability, built-in self-test, and self-checking.</p>
Hideo Fujiwara, Yuzo Takamatsu, Takashi Nanya, Teruhiko Yamada, Hideo Tamamoto, Kiyoshi Furuya, "Test Research in Japan", IEEE Design & Test of Computers, vol.5, no. 5, pp. 60-79, September/October 1988, doi:10.1109/54.7982
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