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ABSTRACT
<p>Surveys recent research activities in test technology for computers, focusing on the results of university researchers. They cover test-pattern generation, fault simulation, design for testability, built-in self-test, and self-checking.</p>
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CITATION
Yuzo Takamatsu, Kiyoshi Furuya, Hideo Tamamoto, Takashi Nanya, Hideo Fujiwara, Teruhiko Yamada, "Test Research in Japan", IEEE Design & Test of Computers, vol. 5, no. , pp. 60-79, September/October 1988, doi:10.1109/54.7982
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