Issue No. 03 - May/June (1988 vol. 5)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.7962
<p>Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes the way each algorithm uses search and backtracking techniques to sensitize a fault and propagate it to an observable point. The heuristics used to guide ATPG search and the notation used to represent circuit values are examined.</p>
T. Kirkland and M. R. Mercer, "Algorithms for Automatic Test-Pattern Generation," in IEEE Design & Test of Computers, vol. 5, no. , pp. 43-55, 1988.