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Issue No. 02 - March/April (1988 vol. 5)
ISSN: 0740-7475
pp: 24-35
ABSTRACT
<p>New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.</p>
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CITATION
Algirdas J. Gruodis, Dale E. Hoffman, "250-MHz Advanced Test Systems", IEEE Design & Test of Computers, vol. 5, no. , pp. 24-35, March/April 1988, doi:10.1109/54.2034
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