Issue No. 02 - March/April (1988 vol. 5)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.2034
<p>New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.</p>
A. J. Gruodis and D. E. Hoffman, "250-MHz Advanced Test Systems," in IEEE Design & Test of Computers, vol. 5, no. , pp. 24-35, 1988.