Issue No. 02 - March/April (1988 vol. 5)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.2033
<p>In-circuit testing is commonly thought to be inefficient for a high level of quality control, and unable to match the high yields of functional testing. A quantitative study of 34,296 boards that represented the testing of 6,671,038 components reveals that in-circuit testing can produce high yields -96.9% in this case. The author looks at this study.</p>
E. O. Schlotzhauer, "Real-World Board Test Effectiveness," in IEEE Design & Test of Computers, vol. 5, no. , pp. 16-23, 1988.