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Issue No. 02 - March/April (1988 vol. 5)
ISSN: 0740-7475
pp: 16-23
ABSTRACT
<p>In-circuit testing is commonly thought to be inefficient for a high level of quality control, and unable to match the high yields of functional testing. A quantitative study of 34,296 boards that represented the testing of 6,671,038 components reveals that in-circuit testing can produce high yields -96.9% in this case. The author looks at this study.</p>
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CITATION
Ed O. Schlotzhauer, "Real-World Board Test Effectiveness", IEEE Design & Test of Computers, vol. 5, no. , pp. 16-23, March/April 1988, doi:10.1109/54.2033
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